DocumentCode :
2641122
Title :
Optimized power combining technique to design a 20dB gain, 13.5dBm OCP1 60GHz power amplifier using 65nm CMOS technology
Author :
Aloui, Sofiane ; Luque, Yohann ; Demirel, Nejdat ; Leite, Bernardo ; Plana, Robert ; Belot, Didier ; Kerherve, Eric
Author_Institution :
IMS Lab., Univ. of Bordeaux, Talence, France
fYear :
2012
fDate :
17-19 June 2012
Firstpage :
53
Lastpage :
56
Abstract :
Millimeter-wave Distributed Active Transformer (DAT), baluns and zero degree 1-4 splitter have been optimized to design a 60 GHz parallel Power Amplifier (PA). The implementation is based on a thin digital 7 metal layers (1P7M) Back End of Line (BEOL) and Low Power (LP) transistors in 65 nm CMOS technology from STMicroelectronics. A lumped model based analysis is presented to compare pure voltage and mixed voltage and current combining techniques. Simulated and measured results are reported. At 61 GHz, the PA achieves a peak power gain of 20 dB with a 13.5 dBm 1dB-output compression point (OCP1dB), 15.6 dBm output power and a Power Added Efficiency (PAE) of 6.6% from a 1.2 V supply. To the author´s knowledge, these results represent the highest linear output power and gain performances among PAs using the same technology.
Keywords :
CMOS analogue integrated circuits; field effect MIMIC; impedance convertors; millimetre wave power amplifiers; millimetre wave transistors; power combiners; 1P7M; BEOL; CMOS technology; LP transistors; OCP1 power amplifier; STMicroelectronics; back end of line; baluns; current combining techniques; efficiency 6.6 percent; frequency 60 GHz; frequency 61 GHz; gain 20 dB; low power transistors; lumped model based analysis; millimeter-wave DAT; millimeter-wave distributed active transformer; mixed voltage techniques; optimized power combining technique; parallel power amplifier; power added efficiency; pure voltage techniques; size 65 nm; thin digital 7 metal layers; voltage 1.2 V; zero degree splitter; CMOS integrated circuits; CMOS technology; Gain; Impedance matching; Insertion loss; Power generation; Transistors; CMOS technology; Power amplifiers; millimeter wave communication; transformers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2012 IEEE
Conference_Location :
Montreal, QC
ISSN :
1529-2517
Print_ISBN :
978-1-4673-0413-9
Electronic_ISBN :
1529-2517
Type :
conf
DOI :
10.1109/RFIC.2012.6242230
Filename :
6242230
Link To Document :
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