Title :
A 21.8–27.5GHz PLL in 32nm SOI using Gm linearization to achieve −130dBc/Hz phase noise at 10MHz offset from a 22GHz carrier
Author :
Sadhu, Bodhisatwa ; Ferriss, Mark A. ; Plouchart, Jean-Olivier ; Natarajan, Arun S. ; Rylyakov, Alexander V. ; Valdes-Garcia, Alberto ; Parker, Benjamin D. ; Reynolds, Scott ; Babakhani, Aydin ; Yaldiz, Soner ; Pileggi, Larry ; Harjani, Ramesh ; Tierno, J
Author_Institution :
Univ. of Minnesota, Minneapolis, MN, USA
Abstract :
This paper describes a new approach to low phase noise LC VCO design based on transconductance linearization of the active devices. A prototype 25GHz VCO based on this approach is integrated in a dual loop PLL and achieves superior performance compared to the state of the art. The design is implemented in the 32nm SOI deep sub-micron CMOS technology and achieves a phase noise of -130dBc/Hz at 10MHz offset from a 22GHz carrier. Additionally, the paper introduces a new layout approach for switched capacitor arrays that enables a wide tuning range of 23%. More than 500 measurements across PVT variations validate the proposed PLL design: phase noise variation across 46 dies for 3 different frequencies is σ <; 0.6dB, across supply variation over 0.7-1.5V is 2dB and across 80°C temperature variation is 2dB. At the 25GHz center frequency, the VCO FOMT is 188dBc/Hz.
Keywords :
CMOS analogue integrated circuits; elemental semiconductors; linearisation techniques; microwave integrated circuits; microwave oscillators; phase locked loops; phase noise; silicon; silicon-on-insulator; switched capacitor networks; voltage-controlled oscillators; Gm linearization; PVT supply variation; SOI deep sub-micron CMOS technology; Si; dual loop PLL; frequency 21.8 GHz to 27.5 GHz; gain 2 dB; low phase noise LC VCO design; size 32 nm; switched capacitor array; temperature 80 degC; transconductance linearization; voltage 0.7 V to 1.5 V; Capacitors; Inductors; Phase locked loops; Phase noise; Tuning; Voltage-controlled oscillators; 60GHz; PLL; VCO; phase noise; transconducance linearization; tuning range;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2012 IEEE
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-0413-9
Electronic_ISBN :
1529-2517
DOI :
10.1109/RFIC.2012.6242235