DocumentCode :
2641996
Title :
Beyond multiple choice exams: Using computerized lexical analysis to understand students´ conceptual reasoning in STEM disciplines
Author :
Urban-Lurain, Mark ; Moscarella, Rosa A. ; Haudek, Kevin C. ; Giese, Emma ; Sibley, Duncan F. ; Merrill, John E.
fYear :
2009
fDate :
18-21 Oct. 2009
Firstpage :
1
Lastpage :
6
Abstract :
Constructed response questions - in which students must use their own language in order to explain a phenomenon - create more meaningful opportunities for instructors to identify their students´ learning obstacles than multiple choice questions. However, the realities of typical large-enrollment undergraduate classes restrict the options faculty have for moving towards more learner-focused instruction. We are exploring the use of computerized lexical analysis of students´ writing in large enrollment undergraduate biology and geology courses. We have created libraries that categorize student responses with > 90% accuracy. These categories can be used to predict expert ratings of student responses with accuracy approaching inter-rater reliability among expert raters. These techniques also provide insight into students´ use of analogical thinking, a fundamental part of scientific modeling. These techniques have potential for improving assessment practices across STEM disciplines.
Keywords :
educational courses; STEM disciplines; computerized lexical analysis; constructed response questions; interrater reliability; large enrollment undergraduate courses; multiple choice exams; student conceptual reasoning; Biochemical analysis; Biology computing; Cells (biology); Chemistry; Education; Educational institutions; Geology; Software libraries; Text analysis; Writing; Assessment; Conceptual barriers; Constructed responses; Lexical analysis software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frontiers in Education Conference, 2009. FIE '09. 39th IEEE
Conference_Location :
San Antonio, TX
ISSN :
0190-5848
Print_ISBN :
978-1-4244-4715-2
Electronic_ISBN :
0190-5848
Type :
conf
DOI :
10.1109/FIE.2009.5350596
Filename :
5350596
Link To Document :
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