• DocumentCode
    2641996
  • Title

    Beyond multiple choice exams: Using computerized lexical analysis to understand students´ conceptual reasoning in STEM disciplines

  • Author

    Urban-Lurain, Mark ; Moscarella, Rosa A. ; Haudek, Kevin C. ; Giese, Emma ; Sibley, Duncan F. ; Merrill, John E.

  • fYear
    2009
  • fDate
    18-21 Oct. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Constructed response questions - in which students must use their own language in order to explain a phenomenon - create more meaningful opportunities for instructors to identify their students´ learning obstacles than multiple choice questions. However, the realities of typical large-enrollment undergraduate classes restrict the options faculty have for moving towards more learner-focused instruction. We are exploring the use of computerized lexical analysis of students´ writing in large enrollment undergraduate biology and geology courses. We have created libraries that categorize student responses with > 90% accuracy. These categories can be used to predict expert ratings of student responses with accuracy approaching inter-rater reliability among expert raters. These techniques also provide insight into students´ use of analogical thinking, a fundamental part of scientific modeling. These techniques have potential for improving assessment practices across STEM disciplines.
  • Keywords
    educational courses; STEM disciplines; computerized lexical analysis; constructed response questions; interrater reliability; large enrollment undergraduate courses; multiple choice exams; student conceptual reasoning; Biochemical analysis; Biology computing; Cells (biology); Chemistry; Education; Educational institutions; Geology; Software libraries; Text analysis; Writing; Assessment; Conceptual barriers; Constructed responses; Lexical analysis software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frontiers in Education Conference, 2009. FIE '09. 39th IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    0190-5848
  • Print_ISBN
    978-1-4244-4715-2
  • Electronic_ISBN
    0190-5848
  • Type

    conf

  • DOI
    10.1109/FIE.2009.5350596
  • Filename
    5350596