DocumentCode :
2642148
Title :
Engineering Trust with Semantic Guardians
Author :
Wagner, Ilya ; Bertacco, Valeria
Author_Institution :
Adv. Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI
fYear :
2007
fDate :
16-20 April 2007
Firstpage :
1
Lastpage :
6
Abstract :
The ability to guarantee the functional correctness of digital integrated circuits and, in particular, complex microprocessors, is a key task in the production of secure and trusted systems. Unfortunately, this goal remains today an unfulfilled challenge, as even the most straightforward practical designs are released with latent bugs. Patching techniques can repair some of these escaped bugs, however, they often incur a performance overhead, and most importantly, they can only be deployed after an escaped bug has been exposed at the customer site. In this paper we present a novel approach to guaranteeing correct system operation by deploying a semantic guardian component. The semantic guardian is an additional control logic block which is included in the design, and can switch the microprocessor´s mode of operation from its normal, high-performance but error-prone mode, to a secure, formally verified safe mode, guaranteeing that the execution will be functionally correct. We explore several frameworks where a selective use of the safe mode can enhance the overall functional correctness of a processor. Additionally, we observe through experimentation that semantic guardians facilitate the trade-off between the design validation effort and the performance and area cost of the final secure product. The experimental results show that the area cost and performance overheads of a semantic guardian can be as small as 3.5% and 5%, respectively
Keywords :
logic design; microprocessor chips; security of data; complex microprocessors; control logic block; design validation; digital integrated circuits; error-prone mode; escaped bugs; formally verified safe mode; patching techniques; secure systems; semantic guardians; trusted systems; Computer architecture; Computer bugs; Costs; Digital integrated circuits; Hardware; Logic design; Microprocessors; Military computing; Security; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
Type :
conf
DOI :
10.1109/DATE.2007.364684
Filename :
4211889
Link To Document :
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