Title :
Design and DfT of a High-Speed Area-Efficient Embedded Asynchronous FIFO
Author :
Wielage, Paul ; Marinissen, Erik Jan ; Altheimer, Michel ; Wouters, Clemens
Author_Institution :
NXP Semicond., Eindhoven
Abstract :
Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded ripple-through FIFO module with asynchronous read and write clocks. The implementation is based on a micropipeline architecture and is at least a factor two smaller than SRAM-based and standard-cell-based counterparts. This paper gives an overview of the most important design features of the new FIFO module and describes its test and design-for-test approach
Keywords :
SRAM chips; design for testability; integrated circuit design; modules; FIFO; IC designs; SRAM; design for test; embedded asynchronous; first-in first-out memories; micropipeline architecture; Automatic testing; Clocks; Communication system control; Design for testability; Integrated circuit testing; Marine technology; Network-on-a-chip; Pipelines; Random access memory; Software libraries;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
DOI :
10.1109/DATE.2007.364399