• DocumentCode
    2642507
  • Title

    Design and DfT of a High-Speed Area-Efficient Embedded Asynchronous FIFO

  • Author

    Wielage, Paul ; Marinissen, Erik Jan ; Altheimer, Michel ; Wouters, Clemens

  • Author_Institution
    NXP Semicond., Eindhoven
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded ripple-through FIFO module with asynchronous read and write clocks. The implementation is based on a micropipeline architecture and is at least a factor two smaller than SRAM-based and standard-cell-based counterparts. This paper gives an overview of the most important design features of the new FIFO module and describes its test and design-for-test approach
  • Keywords
    SRAM chips; design for testability; integrated circuit design; modules; FIFO; IC designs; SRAM; design for test; embedded asynchronous; first-in first-out memories; micropipeline architecture; Automatic testing; Clocks; Communication system control; Design for testability; Integrated circuit testing; Marine technology; Network-on-a-chip; Pipelines; Random access memory; Software libraries;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364399
  • Filename
    4211909