DocumentCode
2642775
Title
RF Reliability Testing of L-Band Power Transistors
Author
Weisenberger, W. ; Dodson, B.C., Jr. ; Christou, A.
Volume
74
Issue
1
fYear
1974
fDate
12-14 June 1974
Firstpage
138
Lastpage
138
Abstract
Accelerated life tests using pulsed rf power conditions have been incorporated in order to evaluate the reliability of L-band power transistors for use in phased array RADAR programs. The basic philosophies, test procedures, and diagnostic techniques used will be explained and an explanation of how to use the data will be given.
Keywords
L-band; Life estimation; Life testing; Phased arrays; Power transistors; Radar; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1974 S-MTT International
Conference_Location
Atlanta, Georgia, USA
Type
conf
DOI
10.1109/MWSYM.1974.1123511
Filename
1123511
Link To Document