• DocumentCode
    2642785
  • Title

    Investigations of RF Induced Burnout in Microwave Mixer Diodes: A Continuing Study

  • Author

    Morris, G.E. ; Hall, G.A. ; Cook, C.F. ; Higgins, V.J.

  • Volume
    74
  • Issue
    1
  • fYear
    1974
  • fDate
    12-14 June 1974
  • Firstpage
    139
  • Lastpage
    141
  • Abstract
    Investigations of RF induced burnout in silicon point contact and Schottky barrier mixer diodes at X-band frequencies are presented. SEM observation of diode chip condition was made through a "window" in the package prior to burnout. Comparisons of photographs before and after burnout were used to determine subtle changes in chip topography.
  • Keywords
    Degradation; Packaging; Radio frequency; Schottky barriers; Schottky diodes; Semiconductor diodes; Silicon; Space vector pulse width modulation; Surface topography; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1974 S-MTT International
  • Conference_Location
    Atlanta, Georgia, USA
  • Type

    conf

  • DOI
    10.1109/MWSYM.1974.1123512
  • Filename
    1123512
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2642785