Title :
Testing in the Year 2020
Author :
Galivanche, Rajesh ; Kapur, Rohit ; Rubio, Antonio
Author_Institution :
Intel Corp., Santa Clara, CA
Abstract :
Testing today of a several hundred million transistor system-on-chip with analog, RF blocks, many processor cores and tens of memories is a huge task. What the test technology be like in year 2020 with hundreds of billions of transistors on a single chip? Can we get there with tweaks to today´s technology? While the exact nature of the circuit styles, architectural innovations and product innovations in year 2020 are highly speculative at this point, we examine the impact of likely design and process technology trends on testing methods
Keywords :
logic testing; system-on-chip; RF blocks; processor cores; system-on-chip testing; Automatic testing; CMOS technology; Circuit faults; Circuit testing; Integrated circuit testing; Isolation technology; Logic testing; Semiconductor device testing; System testing; Technological innovation;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
DOI :
10.1109/DATE.2007.364417
