• DocumentCode
    2642956
  • Title

    Accurate Timing Analysis using SAT and Pattern-Dependent Delay Models

  • Author

    Tadesse, D. ; Sheffield, D. ; Lenge, E. ; Bahar, R.I. ; Grodstein, J.

  • Author_Institution
    Div. of Eng., Brown Univ., Providence, RI
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Accurate delay modeling beyond static models is critical to garnering better correlation with post-silicon analysis. Furthermore, post-silicon timing validation requires a pattern-dependent timing model to generate patterns. To address these issues, a timing analysis tool was proposed that integrates a data-dependent delay model into its analysis. The approach solves for the delay by using the concept of circuit unrolling and formulation of timing questions as decision problems for input into a SAT solver. The effectiveness and validity of the proposed methodology is illustrated through experiments on benchmark circuits
  • Keywords
    delays; integrated circuit modelling; integrated circuit testing; logic CAD; timing; SAT solver; circuit unrolling; delay modeling; pattern-dependent delay models; post-silicon analysis; timing analysis tool; timing questions; Circuit faults; Circuit testing; Crosstalk; Delay effects; Delay estimation; Logic; Pattern analysis; Silicon; Test pattern generators; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364427
  • Filename
    4211937