Title :
PASTEL: a parameterized memory characterization system
Author :
Ogawa, Kimihiro ; Kohno, Michinari ; Kitamura, Fusako
Author_Institution :
Design Autom. Dept., Sony Corp., Japan
Abstract :
PASTEL is a parameterized memory characterization system which extracts the characteristics of ASIC on-chip-memories such as delay, timing and power consumption which are important in LSI logic design. PASTEL is a fully-automated process from exact wire-RC extraction through circuit reduction, input vector generation, waveform measurement, data-sheet and library creation. The circuit reduction scheme can reduce the circuit simulation time by 2 order of magnitude while maintaining delay error within 100 ps of exact simulation
Keywords :
application specific integrated circuits; circuit CAD; circuit analysis computing; delays; integrated memory circuits; large scale integration; logic CAD; random-access storage; timing; waveform analysis; ASIC on-chip memories; LSI logic design; PASTEL; circuit reduction; circuit simulation; data-sheet creation; delay; input vector generation; library creation; parameterized memory characterization system; power consumption; timing; waveform measurement; wire-RC extraction; Character generation; Circuit simulation; Data mining;
Conference_Titel :
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-8359-7
DOI :
10.1109/DATE.1998.655831
