Abstract :
The following topics are dealt with: microprocessor test and verification; automated debugging; SoC testing; schedulability analysis; model checking; system-on-chip reliability; functional stress pattern generation; fault grading; software-based self-test program; hardware-software codesign; abstract state machines; electronic design logic simulation; and graphics processing units.
Keywords :
automatic test software; built-in self test; computer debugging; computer graphic equipment; coprocessors; fault diagnosis; finite state machines; formal verification; hardware-software codesign; integrated circuit reliability; logic design; logic simulation; logic testing; processor scheduling; system-on-chip; SoC testing; abstract state machines; automated debugging; electronic design logic simulation; fault grading; functional stress pattern generation; graphics processing units; hardware-software codesign; microprocessor test; microprocessor verification; model checking; schedulability analysis; software-based self-test program; system-on-chip reliability;
Conference_Titel :
Microprocessor Test and Verification (MTV), 2010 11th International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-61284-287-5
