• DocumentCode
    2643957
  • Title

    Spintronics primitive gate with high error correction efficiency 6(Perror)2 for logic-in memory architecture

  • Author

    Tsuji, Y. ; Nebashi, R. ; Sakimura, N. ; Morioka, A. ; Honjo, H. ; Tokutome, K. ; Miura, S. ; Suzuki, T. ; Fukami, S. ; Kinoshita, K. ; Hanyu, T. ; Endoh, T. ; Kasai, N. ; Ohno, H. ; Sugibayashi, T.

  • Author_Institution
    NEC Corp., Kawasaki, Japan
  • fYear
    2012
  • fDate
    12-14 June 2012
  • Firstpage
    63
  • Lastpage
    64
  • Abstract
    A spintronics primitive gate with redundancy was designed using domain wall motion (DWM) cells, and the data-missing rate was drastically improved to ~6 (Perror)2 when the error rate per DWM cell was Perror. All the DWM cells aligned in series were written simultaneously, which suppressed the increase in power consumption when writing. Application of 4-terminal DWM cells with physically separated current paths for writing and reading saved extra path transistors for redundancy and there were no area overheads.
  • Keywords
    logic circuits; memory architecture; power consumption; domain wall motion cells; error rate per DWM cell; extra path transistors; high error correction efficiency; logic-in memory architecture; power consumption; spintronics primitive gate; Error analysis; Logic gates; Magnetic domain walls; Magnetic tunneling; Magnetoelectronics; Redundancy; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSIT), 2012 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0743-1562
  • Print_ISBN
    978-1-4673-0846-5
  • Electronic_ISBN
    0743-1562
  • Type

    conf

  • DOI
    10.1109/VLSIT.2012.6242462
  • Filename
    6242462