DocumentCode :
2644080
Title :
Optogalvanic spectroscopy of the zeeman effect in singly-ionized xenon
Author :
Smith, Timothy B. ; Ngom, Bailo B. ; Gallimore, Alec D.
Author_Institution :
Michigan Univ., Ann Arbor, MI
fYear :
2006
fDate :
4-8 June 2006
Firstpage :
15
Lastpage :
15
Abstract :
Summary form only given. We present optogalvanic measurements of Zeeman effects on two xenon lines: the 5d 2F7/2 rarr 6p 2D0 5/2 transition of singly-ionized xenon at 834.724 nm and the 6p [3/2]1 rarr 6d [5/2]0 1 transition of neutral xenon at 834.745 nm. Hamamatsu L2783 xenon-neon galvatron is placed in the gap of a C-coil electromagnet with the laser beam path perpendicular to the magnetic field. Excitation is provided by a narrow-linewidth TUI Optics TA-100/830 tapered-amplifier diode laser; lock-in amplification isolates the optogalvanic signal from noise in the galvatron discharge. A half-wave plate controls the polarization of the beam, permitting separation of the components. By comparing the observed spectra with computational models of the Zeeman effect on fine and hyperfine energy levels, we explore the utility of Zeeman splitting of xenon laser-induced fluorescence spectra as a magnetic component intensity diagnostic in electrostatic thruster plumes
Keywords :
Zeeman effect; high-frequency discharges; optogalvanic spectroscopy; plasma diagnostics; plasma light propagation; xenon; 834.724 nm; 834.745 nm; C-coil electromagnet; Hamamatsu L2783 xenon-neon galvatron; TUI Optics TA-100/830 tapered-amplifier diode laser; Xe; Zeeman effect; electrostatic thruster plumes; galvatron discharge; half-wave plate; hyperfine energy levels; laser beam path; laser-induced fluorescence spectra; lock-in amplification; magnetic component intensity diagnostic; optogalvanic spectroscopy; singly-ionized xenon; Electromagnets; Laser beams; Laser excitation; Laser noise; Laser transitions; Magnetic fields; Optical noise; Spectroscopy; Stimulated emission; Xenon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
Conference_Location :
Traverse City, MI
Print_ISBN :
1-4244-0125-9
Type :
conf
DOI :
10.1109/PLASMA.2006.1706887
Filename :
1706887
Link To Document :
بازگشت