Title :
Verification-Guided Soft Error Resilience
Author :
Seshia, Sanjit A. ; Li, Wenchao ; Mitra, Subhasish
Author_Institution :
California Univ., Berkeley, CA
Abstract :
Algorithmic techniques for formal verification can be used not just for bug-finding, but also to estimate vulnerability to reliability problems and to reduce overheads of circuit mechanisms for error resilience. We demonstrate this idea of verification-guided error resilience in the context of soft errors in latches. We show how model checking can be used to identify latches in a circuit that must be protected in order that the circuit satisfies a formal specification. Experimental results on a Verilog implementation of the ESA SpaceWire communication protocol indicate that the power overhead of soft error protection can be reduced by a factor of 4.35 by using our approach rather than protecting all latches
Keywords :
error detection; flip-flops; formal specification; formal verification; SpaceWire communication protocol; formal specification; formal verification; model checking; power overhead; verification-guided soft error resilience; Circuit faults; Error analysis; Fault diagnosis; Formal specifications; Hardware design languages; Latches; Power system protection; Power system reliability; Protocols; Resilience;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
DOI :
10.1109/DATE.2007.364501