• DocumentCode
    2644419
  • Title

    Maximum Circuit Activity Estimation Using Pseudo-Boolean Satisfiability

  • Author

    Mangassarian, Hratch ; Veneris, Andreas ; Safarpour, Sean ; Najm, Farid N. ; Abadir, Magdy S.

  • Author_Institution
    Dept. of ECE, Toronto Univ., Ont.
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Disproportionate instantaneous power dissipation may result in unexpected power supply voltage fluctuations and permanent circuit damage. Therefore, estimation of maximum instantaneous power is crucial for the reliability assessment of VLSI chips. Circuit activity and consequently power dissipation in CMOS circuits are highly input-pattern dependent, making the problem of maximum power estimation computationally hard. This work proposes a novel pseudo-Boolean satisfiability based method that reports the exact input sequence maximizing circuit activity in combinational and sequential circuits. The method is also extended to take multiple gate transitions into account by integrating delay information into the pseudo-Boolean optimization problem. An extensive suite of experiments on ISCAS85 and ISCAS89 circuits confirms the efficiency and robustness of the approach compared to simulation based techniques and encourages further research for low-power solutions using Boolean satisfiability
  • Keywords
    Boolean functions; CMOS integrated circuits; VLSI; combinational circuits; computability; integrated circuit reliability; low-power electronics; sequential circuits; CMOS circuits; VLSI chips; circuit damage; combinational circuits; instantaneous power dissipation; power estimation; power supply voltage fluctuations; pseudo-Boolean satisfiability; reliability assessment; sequential circuits; Circuit simulation; Delay; Optimization methods; Power dissipation; Power supplies; Robustness; Sequential circuits; Signal generators; Upper bound; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364519
  • Filename
    4212029