DocumentCode :
2644463
Title :
Automatic Fault Localization for SystemC TLM Designs
Author :
Le, Hoang M. ; Grosse, Daniel ; Drechsler, Rolf
Author_Institution :
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
fYear :
2010
fDate :
13-15 Dec. 2010
Firstpage :
35
Lastpage :
40
Abstract :
To meet today´s time-to-market demands catching bugs as early as possible during the design of a system is absolutely essential. In Electronic System Level (ESL) design where SystemC has become the de-facto standard due to Transaction Level Modeling (TLM), many approaches for verification have been developed. They determine an error trace which demonstrates the difference between the required and the actual behavior of the system. However, the subsequent debugging process is very time-consuming, in particular due to TLM-related faults caused by complex process synchronization and concurrency. In this paper, we present an automatic fault localization approach for SystemC TLM designs. The approach determines components that can be changed such that the intended behavior of the design is obtained removing the contradiction given by the error trace. Techniques based on Bounded Model Checking (BMC) are used to find the components. We demonstrate the quality of our approach by experimental results.
Keywords :
C++ language; formal verification; software fault tolerance; SystemC TLM designs; bounded model checking; electronic system level design; fault localization approach; transaction level modeling; Debugging; Instruments; Object oriented modeling; Receivers; Schedules; Time domain analysis; Time varying systems; BMC; Debugging; SystemC; TLM;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification (MTV), 2010 11th International Workshop on
Conference_Location :
Austin, TX
ISSN :
1550-409
Print_ISBN :
978-1-61284-287-5
Type :
conf
DOI :
10.1109/MTV.2010.15
Filename :
5976241
Link To Document :
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