• DocumentCode
    2644472
  • Title

    Investigation of X-ray emission as a function of wire number and material using a compact 80 kA current generator

  • Author

    Haas, David ; Shipton, Eric ; Fedin, Dimitri ; Ma, Tammy ; Wagschal, Kathy ; Younan, Sal ; Beg, Farhat ; Stephens, Rich ; Lee, Paul

  • Author_Institution
    Dept. of Mech. & Aerosp. Eng., California Univ., San Diego, La Jolla, CA
  • fYear
    2006
  • fDate
    4-8 June 2006
  • Firstpage
    34
  • Lastpage
    34
  • Abstract
    Summary form only given. Results are presented from a compact X-pinch pulser (I~80 kA, risetime ~40 ns). Various wire materials, (tungsten, molybdenum, nickel, stainless steel, and aluminum), number of wires, (2, 3, 4), and thickness (from 5 mum-13 mum) were used. The overall mass per unit length was kept constant. A variety of diagnostics including, laser probing, X-ray framing camera, a set of seven PIN diodes and pinhole camera was used. Information about X-ray spectrum, X-ray pulse length, and X-ray spot size was obtained. The X-pinch consisting of four, 5 mum tungsten wires, showed higher X-ray characteristics with an X-ray energy spectrum from 1-10 keV, spot size <2 mum and an X-ray pulse duration less than 2 ns. For molybdenum X-pinches, the coronal plasma around the wires was observed to merge resulting in a current channel between the electrodes forming a Z-pinch
  • Keywords
    Z pinch; aluminium; corona; molybdenum; nickel; plasma X-ray sources; plasma diagnostics; plasma transport processes; stainless steel; tungsten; 1 to 10 keV; 5 to 13 mum; Al; Mo; Ni; PIN diodes; W; X-pinch pulser; X-ray emission; X-ray energy spectrum; X-ray framing camera; X-ray pulse length; X-ray spot size; Z-pinch; coronal plasma; current channel; current generator; electrodes; laser probing; pinhole camera; Aluminum; Building materials; Cameras; Nickel; Optical materials; Plasma properties; Steel; Tungsten; Wire; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
  • Conference_Location
    Traverse City, MI
  • Print_ISBN
    1-4244-0125-9
  • Type

    conf

  • DOI
    10.1109/PLASMA.2006.1706906
  • Filename
    1706906