• DocumentCode
    2644779
  • Title

    Architectural Leakage-Aware Management of Partitioned Scratchpad Memories

  • Author

    Golubeva, Olga ; Loghi, Mirko ; Poncino, Massimo ; Macii, Enrico

  • Author_Institution
    Dipt. di Automatica e Informatica, Politecnico di Torino
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Partitioning a memory into multiple blocks that can be independently accessed is a widely used technique to reduce its dynamic power. For embedded systems, its benefits can be even pushed further by properly matching the partition to the memory access patterns. When leakage energy comes into play, however, idle memory blocks must be put into a proper low-leakage sleep state to actually save energy when not accessed. In this case, the matching becomes an instance of power management problem, because moving to and from this sleep state requires additional energy. In this work, we propose an explorative solution to the problem of leakage-aware partitioning of a memory into disjoint sub-blocks. In particular, we target scratchpad memories, which are commonly used in some embedded systems as a replacement of caches. We show that the total energy (dynamic and static) cost function yields a non-convex partitioning space, making smart exploration the only viable option; we propose an effective randomized search in the solution space which has very good match with the results of exhaustive exploration, when this is feasible. Experiments on a different sets of embedded applications has shown that total energy savings larger than 60% on average can be obtained, with a marginal overhead in execution time, thanks to an effective implementation of the low-leakage sleep state
  • Keywords
    cache storage; electrical faults; embedded systems; caches; embedded systems; idle memory blocks; leakage aware management; leakage energy; memory access patterns; multiple blocks; non-convex partitioning space; scratchpad memories; smart exploration; Cost function; Embedded system; Energy management; Leakage current; Memory management; Partitioning algorithms; Power system management; Scanning probe microscopy; Sleep; Space exploration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364541
  • Filename
    4212051