Title :
Microwave characterization of thin-film multi-chip module substrates and printed wiring boards accounting for frequency-dependent characteristic impedance
Author :
Steer, Michael B. ; Franzon, Paul D.
Author_Institution :
Picosecond digital Systems Laboratory and the Department of Electrical Engineering, North Carolina State University, Raleigh, NC 27695-7911
Keywords :
Calibration; Capacitance; Conductors; Electrical resistance measurement; Frequency; Impedance; Substrates; Testing; Transistors; Wiring;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1992
Print_ISBN :
0-7803-0683-X
DOI :
10.1109/EPEP.1992.572285
