DocumentCode :
2645522
Title :
Application of feedforward and adaptive feedback control to semiconductor device manufacturing
Author :
Stoddard, K. ; Crouch, P. ; Kozicki, M. ; Tsakalis, K.
Author_Institution :
Center for Syst. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA
Volume :
1
fYear :
1994
fDate :
29 June-1 July 1994
Firstpage :
892
Abstract :
A feedforward and adaptive feedback control methodology is developed and experimentally applied to several different processes commonly used in the fabrication of semiconductor integrated circuit devices. A circular parallel-plate capacitor with a glass (SiO2) dielectric is manufactured on silicon wafers to illustrate the use of these control strategies in the processes of silicon oxidation, aluminum metallization, lithography, and aluminum etching. The goal is to maintain a constant capacitance value on a run to run basis regardless of disturbances or modeling errors in the processes.
Keywords :
adaptive control; feedback; feedforward; semiconductor device manufacture; Al; Si; Si-SiO2-Al; adaptive feedback control; aluminum etching; aluminum metallization; circular parallel-plate capacitor; feedforward; glass dielectric; lithography; semiconductor device manufacturing; semiconductor integrated circuit devices; silicon oxidation; silicon wafers; Adaptive control; Aluminum; Capacitors; Fabrication; Feedback control; Glass; Programmable control; Semiconductor device manufacture; Semiconductor devices; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 1994
Print_ISBN :
0-7803-1783-1
Type :
conf
DOI :
10.1109/ACC.1994.751872
Filename :
751872
Link To Document :
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