• DocumentCode
    2645542
  • Title

    A numerically efficient semiconductor model with Fermi-Dirac thermalization dynamics (band-filling) for FDTD simulation of optoelectronic and photonic devices

  • Author

    Huang, Y. ; Ho, S.T.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA
  • Volume
    1
  • fYear
    2005
  • fDate
    22-27 May 2005
  • Firstpage
    253
  • Abstract
    We describe a numerically efficient semiconductor model for FDTD simulation of optoelectronic and photonic devices that include the essential carrier dynamics such as band filling with Fermi-Dirac thermalization, spectral hole burning, and refractive index change.
  • Keywords
    band structure; finite difference time-domain analysis; optical hole burning; optoelectronic devices; refractive index; semiconductor device models; FDTD simulation; Fermi-Dirac thermalization dynamics; band filling; carrier dynamics; optoelectronic devices; photonic devices; refractive index; semiconductor model; spectral hole burning; Analytical models; Computational modeling; Computer simulation; Energy states; Finite difference methods; Maxwell equations; Numerical models; Polarization; Thermal engineering; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2005. QELS '05
  • Print_ISBN
    1-55752-796-2
  • Type

    conf

  • DOI
    10.1109/QELS.2005.1548744
  • Filename
    1548744