Title :
Aliasing probability in multiple input linear signature automata for q-ary symmetric errors
Author :
Edirisooriya, Geetani ; Robinson, John P.
Author_Institution :
Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Abstract :
The aliasing probability in single and multiple input linear automata signature registers (LASRs: linear feedback shift registers (LFSRs) and linear cellular automata) has been widely studied under the independent bit error model. Aliasing in a class of multiple-input LASRs (MILASRs) under the q-ary symmetric error model is examined. By modeling the signature analyzer as a two state Markov process, it is shown that the closed form expression previously derived for aliasing probability for multiple-input LFSRs with primitive polynomials holds for a far more general class of linear automata signature analyzers, including all multiple-input LFSRs. An easily verifiable criterion is given to determine whether a MILASR falls into this category. It is shown that for q-ary symmetric errors, the circuit complexity and the propagation delay can be minimized by using a set of m single bit LFSRs
Keywords :
Markov processes; delays; feedback; finite automata; logic testing; shift registers; aliasing probability; circuit complexity; closed form expression; independent bit error model; linear automata signature registers; linear cellular automata; linear feedback shift registers; multiple input linear signature automata; primitive polynomials; propagation delay; q-ary symmetric errors; signature analyzer; two state Markov process; Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Cities and towns; Computer errors; Markov processes; Polynomials; Registers;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-2270-9
DOI :
10.1109/ICCD.1991.139917