DocumentCode :
2646042
Title :
Improved time-domain characterization of high-speed interconnection structures
Author :
Dhaene, Tom ; Martens, Luc ; Degraeuwe, Peter ; Zutter, Daniel D.
Author_Institution :
Laboratory of Electromagnetism and Acoustics, University of Gent, Sint-Pietersnieuwstraat 41, B-9000 Gent, Belgium
fYear :
1992
fDate :
22-24 Apr 1992
Firstpage :
142
Lastpage :
144
Keywords :
Circuit simulation; Circuit testing; Computational modeling; Frequency domain analysis; Frequency measurement; Impedance; Integrated circuit interconnections; Scattering parameters; Time domain analysis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 1992
Print_ISBN :
0-7803-0683-X
Type :
conf
DOI :
10.1109/EPEP.1992.572289
Filename :
572289
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2646042
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