Title :
A New Load-Pull Characterization Method for Microwave Power Transistors
Author :
Takayama, Yoichiro
Abstract :
A novel method for microwave power transistor load-pull characterization is presented. The method provides an equivalent load-pull measurement technique without using an output impedance tuner. In this method, both input and output ports of a test transistor are simultaneously driven by external signals at the same specified frequency. Results of its application to a medium-power GaAs FET are given.
Keywords :
Frequency; Gallium arsenide; Impedance; Measurement techniques; Microwave FETs; Microwave theory and techniques; Microwave transistors; Power transistors; Testing; Tuners;
Conference_Titel :
Microwave Symposium, 1976 IEEE-MTT-S International
Conference_Location :
Cherry Hill, NJ, USA
DOI :
10.1109/MWSYM.1976.1123701
