Title :
A V-Band Network Analyzer/Reflection Test Unit
Author :
Yuan, L.T. ; Yamaguchi, G.M. ; Raue, J.E.
Abstract :
This paper describes the design, fabrication and performance of a novel V-band network analyzer/reflection test unit which is capable of operation over a wide frequency range in the 50 to 75 GHz band. The broadband performance of the reflection test unit design results in a continuous measurement over a 10 GHz band with a single sweep. The reflection test unit, utilizing a matched pair of wideband crossbar mixers, features high tracking ability, low source reflection coefficient (i.e., <0.08) and high system directivity (i.e., >31 dB).
Keywords :
Circuit testing; Directional couplers; Frequency measurement; Mixers; Oscillators; Performance evaluation; Radio frequency; Reflection; Schottky diodes; System testing;
Conference_Titel :
Microwave Symposium, 1976 IEEE-MTT-S International
Conference_Location :
Cherry Hill, NJ, USA
DOI :
10.1109/MWSYM.1976.1123702