Title :
On the manifestation of faults to errors in signature analysis
Author :
Chan, John C. ; Womack, Baxter F. ; Wong, D.F.
Author_Institution :
IBM Corp., Austin, TX, USA
Abstract :
The study of the relation between faults and its syndromes in the signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights into the use of deterministic test patterns in signature analysis
Keywords :
fault location; logic testing; computer hardware testing; deterministic test patterns; error distributions; error sequences; error-control code; fault coverage; faults; formal analysis; signature analysis; syndromes; Built-in self-test; Circuit faults; Circuit testing; Computer errors; Error analysis; Fault detection; Fault diagnosis; Linear feedback shift registers; Logic testing; Polynomials;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-2270-9
DOI :
10.1109/ICCD.1991.139919
