Title :
Fast solution of electromagnetic scattering from thin dielectric coated conducting structures by improved EFIE
Author :
Hu, Lun ; Lei, Lin ; Nie, Zaiping ; He, Shiquan
Author_Institution :
Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
In this paper, MLFMA is implemented in the IEFIE to compute scattering from complex conducting structure coated by thin dielectric material. Numerical results demonstrate the efficiency and validity of the present method.
Keywords :
conducting materials; dielectric materials; electric field integral equations; electromagnetic wave scattering; magnetic field integral equations; EFIE; MLFMA; electromagnetic scattering; thin dielectric coated conducting structures; Acceleration; Coatings; Computational efficiency; Dielectric materials; Electromagnetic scattering; Electronic mail; Impedance; Integral equations; MLFMA; Partial response channels;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
Conference_Location :
Charleston, SC
Print_ISBN :
978-1-4244-3647-7
DOI :
10.1109/APS.2009.5171650
