Title :
A Fuzzing technology with a data sample combination
Author :
Wu, Zhi-yong ; Sun, Le-Chang ; Tang, He-Ping ; Zhang, Min ; Liu, Jing-Ju
Author_Institution :
Dept. of Network Eng., Electron. Eng. Inst. Hefei, Hefei, China
Abstract :
Knowledge-based Fuzzing technology successfully applies in software vulnerability mining, however, current Fuzzing technology mainly focuses on fuzzing target software based on single data sample and thus the vulnerability mining results are not stable, false negatives of vulnerability are high and the selection of data sample depends on people´s analysis. To solve these problems, this paper proposes a model named Fuzzing Test Suite Generation model based on data sample combination (FTSGc) which can automatically select data samples combination from large scale data sample set to fuzz target software. To solve Data Sample Combination Problem (DSCP), this paper proposes a method of covering all possible basic blocks in Control Flow Graph (CFG) with minimum running cost and gives a theorem named Maximum Degree Coverage (MFD) to select data sample combination and gets the conclusion that DSCP is actually the Set Covering Problem (SCP). Practical experiment results show that the proposed Fuzzing technology which selects automatically data sample combination based on CFG works much better than current Fuzzing technology on both the Ability of Vulnerability Mining (AVM) and the Efficiency of Vulnerability Mining (EVM).
Keywords :
data mining; flow graphs; fuzzy set theory; security of data; ability of vulnerability mining; control flow graph; data sample combination problem; efficiency of vulnerability mining; fuzzing test suite generation model; knowledge-based fuzzing technology; maximum degree coverage; set covering problem; software vulnerability mining; Automatic control; Automatic testing; Costs; Data engineering; Flow graphs; Genetic algorithms; Large-scale systems; Protocols; Software testing; Sun; AVM; CFG; DSCP; EVM; FTSGc; SCP;
Conference_Titel :
Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6347-3
DOI :
10.1109/ICCET.2010.5485274