DocumentCode

2646481

Title

Decoupling capacitor effects on switching noise

Author

Downing, R. ; Gebler, P. ; Katopis, G.

Author_Institution

East Fishkill Semiconductor Laboratory, IBM

fYear

1992

fDate

22-24 Apr 1992

Firstpage

148

Lastpage

150

Keywords

Capacitors; Circuit noise; Circuit testing; Driver circuits; Noise reduction; Packaging; Probes; Semiconductor device noise; System testing; Vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 1992

Print_ISBN

0-7803-0683-X

Type

conf

DOI

10.1109/EPEP.1992.572291

Filename

572291