Fourier spectrum based periodic cell pattern elimination in thin film transistor liquid crystal display cell image

Author

Jung, Chang-Do ; Kim, Se-Yun ; Lee, Hee-Yul ; Yun, Byoung-Ju ; Lee, Joon-Jae ; Lim, Young-Do ; Park, Kil-Houm

Author_Institution

Dept. of Math., Kyungpook Nat. Univ., Daegu, South Korea

fYear

2011

fDate

9-12 Jan. 2011

Firstpage

871

Lastpage

872

Abstract

This paper presents a hardware that inspects defects on TFT-LCD cell modules and packed in a PCI-board equipped with FPGA and DSP processors. Images of TFT-LCD cell modules normally contain periodic cell patterns which make it difficult to detect defects. We propose an efficient and powerful algorithm for elimination of the cell pattern using magnitude spectrum analysis.

Keywords

digital signal processing chips; discrete Fourier transforms; electronics packaging; field programmable gate arrays; flat panel displays; inspection; liquid crystal displays; thin film transistors; DSP processor; FPGA processor; Fourier spectrum based periodic cell pattern elimination; PCI board; TFT-LCD cell modules; magnitude spectrum analysis; thin film transistor liquid crystal display cell image; Algorithm design and analysis; Digital signal processing; Discrete Fourier transforms; Frequency domain analysis; Inspection; Liquid crystal displays; Thin film transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Consumer Electronics (ICCE), 2011 IEEE International Conference on

Conference_Location

Las Vegas, NV

ISSN

2158-3994

Print_ISBN

978-1-4244-8711-0

Type

conf

DOI

10.1109/ICCE.2011.5722911

Filename

5722911