Title :
EMI prediction using a full-wave analysis method based on a surface formulation
Author :
Ponnapalli, Saila ; Heeb, Hansruedi
Author_Institution :
IBM T. J. Watson Reaearch Center, P.O. Box 218, Yorktown Heights, NY 10598
Keywords :
Boundary conditions; Conducting materials; Conductors; Current; Dielectrics; Electromagnetic interference; Green´s function methods; Magnetic analysis; Magnetic materials; Scattering;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1992
Print_ISBN :
0-7803-0683-X
DOI :
10.1109/EPEP.1992.572302