DocumentCode :
2647243
Title :
Distributed decision fusion using empirical estimation
Author :
Rao, Nageswara S V
Author_Institution :
Center for Eng. Syst. Adv. Res., Oak Ridge Nat. Lab., TN, USA
fYear :
1996
fDate :
8-11 Dec 1996
Firstpage :
697
Lastpage :
704
Abstract :
The problem of optimal data fusion in multiple detector systems is studied in the case where training examples are available, but no a priori information is available about the probability distributions of errors committed by the individual detectors. Earlier solutions to this problem require some knowledge of the error distributions of the detectors, for example, either in a parametric form or in a closed analytical form. Here we show that, given a sufficiently large training sample, an optimal fusion rule can be implemented with an arbitrary level of confidence. We first consider the classical cases of Bayesian rule and Neyman-Pearson test for a system of independent detectors. Then we show a general result that any test function with a suitable Lipschitz property can be implemented with arbitrary precision, based on a training sample whose size is a function of the Lipschitz constant, number of parameters, and empirical measures. The general case subsumes the cases of nonindependent and correlated detectors
Keywords :
Bayes methods; distributed decision making; distributed processing; error statistics; measurement errors; optimisation; sensor fusion; Bayesian rule; Lipschitz property; Neyman-Pearson test; closed analytical form; correlated detectors; detector errors; distributed decision fusion; empirical estimation; error probability distributions; multiple detector systems; nonindependent detectors; optimal data fusion; parametric form; Bayesian methods; Data engineering; Detectors; Distributed computing; Laboratories; Probability distribution; Sensor fusion; Size measurement; System testing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multisensor Fusion and Integration for Intelligent Systems, 1996. IEEE/SICE/RSJ International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3700-X
Type :
conf
DOI :
10.1109/MFI.1996.572305
Filename :
572305
Link To Document :
بازگشت