• DocumentCode
    2647442
  • Title

    Depth estimation using multi-wavelet analysis based stereo vision approach

  • Author

    Bhatti, A. ; Nahavandi, S.

  • Author_Institution
    Deakin Univ., Warrnambool
  • Volume
    4
  • fYear
    2007
  • fDate
    2-4 Nov. 2007
  • Firstpage
    1471
  • Lastpage
    1476
  • Abstract
    The problem of dimensional defects in aluminum die- casting is widespread throughout the foundry industry and their detection is of paramount importance in maintaining product quality. Due to the unpredictable factory environment and metallic, with highly reflective, nature of aluminum die-castings, it is extremely hard to estimate true dimensionality of the die-casting, autonomously. In this work, we propose a novel robust 3D reconstruction algorithm capable of reconstructing dimensionally accurate 3D depth models of the aluminum die-castings. The developed system is very simple and cost effective as it consists of only a stereo cameras pair and a simple fluorescent light. The developed system is capable of estimating surface depths within the tolerance of 1.5 mm. Moreover, the system is invariant to illuminative variations and orientation of the objects in the input image space, which makes the developed system highly robust. Due to its hardware simplicity and robustness, it can be implemented in different factory environments without a significant change in the setup.
  • Keywords
    aluminium; die casting; estimation theory; image reconstruction; production engineering computing; stereo image processing; wavelet transforms; 3D depth model; 3D reconstruction; Al; die-casting; dimensional defects; multiwavelet analysis; stereo camera; stereo vision; surface depth estimation; Aluminum; Casting; Foundries; Image reconstruction; Metal product industries; Metals industry; Production facilities; Reconstruction algorithms; Robustness; Stereo vision; 3D depth estimation; disparity estimation; multiwavelets transform modulus maxima; stereo vision;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wavelet Analysis and Pattern Recognition, 2007. ICWAPR '07. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-1065-1
  • Electronic_ISBN
    978-1-4244-1066-8
  • Type

    conf

  • DOI
    10.1109/ICWAPR.2007.4421682
  • Filename
    4421682