DocumentCode :
2647604
Title :
Oxygen Diffusion At FM-insulator Interfaces In Spin Dependent Tunneling (SDT) Junctions
Author :
Zhang, J. ; White, R.M.
Author_Institution :
Carnegie Mellon University
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Artificial intelligence; Degradation; Electrical resistance measurement; Electrodes; Magnetic separation; Oxygen; Plasma applications; Sputter etching; Sputtering; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597658
Filename :
597658
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2647604
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