Title :
A visually oriented architectural fault simulation environment for WSI
Author :
Ryan, Paul G. ; Saab, Daniel G. ; Fuchs, W. Kent
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana-Champaign, IL, USA
Abstract :
A visually oriented fault simulation environment for WSI architectures based on behavioral simulation of parallel message passing processors and switch-level fault simulation of selected processors is described. The environment was implemented by interfacing the CHAMP switch-level simulator with the OODRA behavioral simulator. The simulation environment was used to measure the fault coverage for a digital adaptive beamforming architecture with a synthetic workload. Fault coverage variation with input set size and array location was investigated. The rate at which faults produce errors in the architecture was also measured
Keywords :
VLSI; fault tolerant computing; integrated circuit technology; microprocessor chips; parallel architectures; CHAMP switch-level simulator; OODRA behavioral simulator; WSI; WSI architectures; array location; behavioral simulation; digital adaptive beamforming architecture; fault coverage; input set size; parallel message passing processors; switch-level fault simulation; synthetic workload; visually oriented fault simulation environment; Array signal processing; Circuit faults; Circuit simulation; Communication switching; Computational modeling; Computer architecture; Fault tolerance; Message passing; Object oriented modeling; Switches;
Conference_Titel :
Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9013-5
DOI :
10.1109/ICWSI.1990.63898