• DocumentCode
    2647957
  • Title

    Hierarchical SoC testing scheduling based on the ant colony algorithm

  • Author

    Cui, Xiaole ; Cheng, Wei ; Wang, Xiaoye ; Yin, Liang ; Sun, Yachun ; Zhou, Yan

  • Author_Institution
    Shenzhen Grad. Sch., Key Lab. of Integrated Micorsystems, Peking Univ., Shenzhen, China
  • fYear
    2009
  • fDate
    20-23 Oct. 2009
  • Firstpage
    1221
  • Lastpage
    1224
  • Abstract
    SoC testing scheduling is an NP hard problem, and it is more complex for the hierarchical SoC architecture. By formulating the SoC testing scheduling problem as a 2-D bin-packing model, this paper solves the problem for the hierarchical SoC with the ant colony optimization (ACO) algorithm to reduce testing application time. Experimental results on ITC´02 benchmark circuits show that the ACO algorithm is more effective than earlier proposed methods.
  • Keywords
    circuit testing; optimisation; system-on-chip; 2D bin-packing model; NP hard problem; ant colony algorithm; hierarchical SoC testing scheduling; Ant colony optimization; Circuit testing; Design for testability; Design optimization; Genetic algorithms; Job shop scheduling; NP-hard problem; Scheduling algorithm; Simulated annealing; Sun; Ant Colony Optimization; Hierarchical SoC; Testing scheduling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2009. ASICON '09. IEEE 8th International Conference on
  • Conference_Location
    Changsha, Hunan
  • Print_ISBN
    978-1-4244-3868-6
  • Electronic_ISBN
    978-1-4244-3870-9
  • Type

    conf

  • DOI
    10.1109/ASICON.2009.5351198
  • Filename
    5351198