DocumentCode :
2648130
Title :
Hierarchical fault tolerance for 3D microelectronics
Author :
Campbell, Michael ; Little, Michael ; Yung, Michael
fYear :
1990
fDate :
23-25 Jan 1990
Firstpage :
174
Lastpage :
188
Abstract :
Describes recent progress in the area of in-use fault tolerance for a massively parallel array processor. Specifically, the authors have taken the existing architecture of the Hughes 3D Computer and added fault tolerance capability to it. This has been possible to accomplish in modular, uniform way because of the unique circuit partitioning and implementation of the 3D Computer. The single instruction multiple data stream (SIMD) design of the 3D Computer greatly simplifies the control and reconfiguration process, while the fine-grained parallelism permits a high degree of redundancy with very low overhead. They have adopted a hierarchical strategy that mirrors the structure of the 3D Computer itself. Static reconfiguration is supported by special purpose hardware, the Realignment Plane wafer type, which allows them to treat failures uniformly at the row/column, processing element, and functional element levels
Keywords :
VLSI; fault tolerant computing; integrated circuit technology; microprocessor chips; parallel architectures; redundancy; 3D microelectronics; Hughes 3D Computer; Realignment Plane wafer; SIMD; circuit partitioning; column redundancy; fine-grained parallelism; functional element redundancy; hierarchical fault tolerance; hierarchical strategy; in-use fault tolerance; massively parallel array processor; processing element redundancy; row redundancy; single instruction multiple data stream; special purpose hardware; treat failures uniformly; Circuits; Computer aided instruction; Computer architecture; Concurrent computing; Fault tolerance; Microelectronics; Mirrors; Parallel processing; Process control; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9013-5
Type :
conf
DOI :
10.1109/ICWSI.1990.63899
Filename :
63899
Link To Document :
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