• DocumentCode
    2648130
  • Title

    Hierarchical fault tolerance for 3D microelectronics

  • Author

    Campbell, Michael ; Little, Michael ; Yung, Michael

  • fYear
    1990
  • fDate
    23-25 Jan 1990
  • Firstpage
    174
  • Lastpage
    188
  • Abstract
    Describes recent progress in the area of in-use fault tolerance for a massively parallel array processor. Specifically, the authors have taken the existing architecture of the Hughes 3D Computer and added fault tolerance capability to it. This has been possible to accomplish in modular, uniform way because of the unique circuit partitioning and implementation of the 3D Computer. The single instruction multiple data stream (SIMD) design of the 3D Computer greatly simplifies the control and reconfiguration process, while the fine-grained parallelism permits a high degree of redundancy with very low overhead. They have adopted a hierarchical strategy that mirrors the structure of the 3D Computer itself. Static reconfiguration is supported by special purpose hardware, the Realignment Plane wafer type, which allows them to treat failures uniformly at the row/column, processing element, and functional element levels
  • Keywords
    VLSI; fault tolerant computing; integrated circuit technology; microprocessor chips; parallel architectures; redundancy; 3D microelectronics; Hughes 3D Computer; Realignment Plane wafer; SIMD; circuit partitioning; column redundancy; fine-grained parallelism; functional element redundancy; hierarchical fault tolerance; hierarchical strategy; in-use fault tolerance; massively parallel array processor; processing element redundancy; row redundancy; single instruction multiple data stream; special purpose hardware; treat failures uniformly; Circuits; Computer aided instruction; Computer architecture; Concurrent computing; Fault tolerance; Microelectronics; Mirrors; Parallel processing; Process control; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-9013-5
  • Type

    conf

  • DOI
    10.1109/ICWSI.1990.63899
  • Filename
    63899