Title :
A numerical model with age reduction factor for warm spare
Author :
Sun, Jian ; Li, Yanfeng ; Liu, Yu ; Huang, Hong-Zhong ; Jin, Tongdan
Author_Institution :
Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
Reliability analysis of industrial systems working in critical situation is complicated due to dynamic behaviors such as sequence-dependency, spares, redundancy management. Systems designed to achieve a desired high reliability often require a high degree of redundancy, standby, and dynamic redundancy management. This paper focuses on modeling the warm spares through a numerical approach. An age reduction factor based on failure accumulating effect is proposed to model the warm spare. The model is validated when the input events within the warm spare gate follows the exponential distribution. The proposed method is further applied to a real system.
Keywords :
fault trees; numerical analysis; Fault Trees; age reduction factor; industrial systems; numerical model; redundancy management; reliability analysis; sequence-dependency; warm spare; Computational modeling; Fault trees; Logic gates; Markov processes; Numerical models; Probability distribution; Reliability; age reduction factor; dynamic fault tree; failure accumulation effect; warm spare;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4577-1229-6
DOI :
10.1109/ICQR2MSE.2011.5976611