DocumentCode :
2648278
Title :
A numerical model with age reduction factor for warm spare
Author :
Sun, Jian ; Li, Yanfeng ; Liu, Yu ; Huang, Hong-Zhong ; Jin, Tongdan
Author_Institution :
Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear :
2011
fDate :
17-19 June 2011
Firstpage :
275
Lastpage :
280
Abstract :
Reliability analysis of industrial systems working in critical situation is complicated due to dynamic behaviors such as sequence-dependency, spares, redundancy management. Systems designed to achieve a desired high reliability often require a high degree of redundancy, standby, and dynamic redundancy management. This paper focuses on modeling the warm spares through a numerical approach. An age reduction factor based on failure accumulating effect is proposed to model the warm spare. The model is validated when the input events within the warm spare gate follows the exponential distribution. The proposed method is further applied to a real system.
Keywords :
fault trees; numerical analysis; Fault Trees; age reduction factor; industrial systems; numerical model; redundancy management; reliability analysis; sequence-dependency; warm spare; Computational modeling; Fault trees; Logic gates; Markov processes; Numerical models; Probability distribution; Reliability; age reduction factor; dynamic fault tree; failure accumulation effect; warm spare;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4577-1229-6
Type :
conf
DOI :
10.1109/ICQR2MSE.2011.5976611
Filename :
5976611
Link To Document :
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