• DocumentCode
    2648333
  • Title

    Polarimetric diffraction tomography

  • Author

    Tyo, J. Scott ; Turner, Theodore S.

  • Author_Institution
    Coll. of Opt. Sci., Univ. of Arizona, Tucson, AZ, USA
  • fYear
    2009
  • fDate
    1-5 June 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Diffraction tomography can directly probe the second-order statistical properties of a random scattering volume. In many sensing tasks, these second-order correlations are all that is necessary to perform classification. In this paper we have generalized the theory of diffraction tomography to include polarized input fields and scattering from anisotropic samples. When the scattering formulation is generalized to the vector form, we must consider the mutual coherency matrix. Because the mutual coherency matrix does not commute with the medium scattering matrix in general, the observed coherency matrix (or Stokes vector) depends on the coherence state of the incident beam. This feature is often overlooked in active polarimetry, and clearly points to the fact that extreme care must be taken when performing Mueller matrix polarimetry with coherent or partially coherent light.
  • Keywords
    electromagnetic wave scattering; geometrical theory of diffraction; matrix algebra; statistical analysis; tomography; Mueller matrix polarimetry; medium scattering matrix; mutual coherency matrix; polarimetric diffraction tomography; random scattering volume; second-order correlation; second-order statistical properties; theory of diffraction tomography; Approximation methods; Educational institutions; Optical diffraction; Optical refraction; Optical scattering; Physical theory of diffraction; Polarization; Random media; Statistics; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
  • Conference_Location
    Charleston, SC
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-3647-7
  • Type

    conf

  • DOI
    10.1109/APS.2009.5171755
  • Filename
    5171755