DocumentCode :
2648359
Title :
Influence of polymer structure on tree growth from a simulated tree channel
Author :
Imai, Kuniharu ; Ito, Kohei ; Shimizu, Noriyuki ; Nawata, Masahito
Author_Institution :
Dept. of Electr. & Electron. Eng., Meijo Univ., Nagoya, Japan
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
337
Abstract :
We have investigated the relationship between partial discharge (PD) in a simulated tree channel and tree growth from its tip. Structural weak-points inside polymer bulk was found to play very important roles in tree growth at low voltage range, especially when channel diameter is large (>30 μm). In this paper, influence of bulk structure on tree growth is discussed with annealed PP specimen. Inception voltage of tree growth in annealed specimen is higher than that in virgin specimen. The inception voltage increases with annealing temperature but independent of annealing time. Voltage dependences of total number of PD pulses required for tree growth and the shape-parameter of Weibull distribution are obtained. In virgin specimen, the shape-parameters m change from m⩽1 to m>1 with increasing applied voltage. However, in annealed specimen always m>1. The annealing effects on structure were analyzed using infrared spectrometer and X-ray diffractometer. Crystallinity and crystal structure of bulk are improved by the annealing process. It is suggested that a part of the amorphous region is recrystallized by the annealing process and structural weak-points are improved
Keywords :
Weibull distribution; insulation testing; organic insulating materials; partial discharges; polymers; power cable insulation; trees (electrical); Weibull distribution; X-ray diffractometer; annealed PP specimen; annealing process; annealing time; channel diameter; inception voltage; infrared spectrometer; partial discharge; polymer structure; simulated tree channel; structural weak-points; tree growth; Annealing; Crystallization; Infrared spectra; Low voltage; Partial discharges; Polymers; Pulse shaping methods; Spectroscopy; Temperature; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-6413-9
Type :
conf
DOI :
10.1109/CEIDP.2000.885295
Filename :
885295
Link To Document :
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