• DocumentCode
    2648522
  • Title

    Formal verification of mixed-signal circuits using extended PSL

  • Author

    Zhang, Meng ; Gao, Deyuan ; Fan, Xiaoya

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Northwestern Polytech. Univ., Xi´´an, China
  • fYear
    2009
  • fDate
    20-23 Oct. 2009
  • Firstpage
    1288
  • Lastpage
    1293
  • Abstract
    As an alternative approach, analyzing hybrid property, the formal method using extended PSL to express specification of mixed-signal circuits is addressed in this paper. With the ability to modeling discrete and continuous dynamic system, Hybrid Automata is adopted in verification of mixed-signal circuits. We extend the PSL to HAPSL (hybrid automata based PSL) with hybrid automata, and define EBNF grammar for the syntax of HAPSL. The continuous temporal property and probabilistic property of mixed-signal circuit can be abstracted by HAPSL. Model Checking is proposed as a formal verifying methodology, in which an on-the- fly checking is preformed for the continuous temporal property, and the checking of probabilistic property is based on hypothesis test. We illustrated this method by analyzing two mixed-signal circuits. The specification of circuit that depends on continuous variables and stochastic process is expressed by HAPSL sentences.
  • Keywords
    electronic engineering computing; formal verification; mixed analogue-digital integrated circuits; stochastic processes; EBNF grammar; continuous temporal property; extended PSL; formal verification; hybrid automata based PSL; hypothesis test; mixed-signal circuits; on-the-fly checking; probabilistic property; property specification language; stochastic process; Abstracts; Automata; Circuit analysis; Circuit testing; Computer science; Formal verification; Integrated circuit technology; State-space methods; Statistics; Stochastic processes; Formal Verification; Mixed-signal Circuit; Model Checking; PSL;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2009. ASICON '09. IEEE 8th International Conference on
  • Conference_Location
    Changsha, Hunan
  • Print_ISBN
    978-1-4244-3868-6
  • Electronic_ISBN
    978-1-4244-3870-9
  • Type

    conf

  • DOI
    10.1109/ASICON.2009.5351231
  • Filename
    5351231