The accelerated life experiment study of Solid State Relay

Author

Zhang, Xiaowen ; Zhang, Hudong

Author_Institution

Nat. Key Lab. of Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component, China Electron. Product Reliability & Environ. Testing Res. Inst., Guangzhou, China

fYear

2011

fDate

17-19 June 2011

Firstpage

349

Lastpage

351

Abstract

The operational principle of SSR (Solid State Relay) has been analyzed, and the methods of acceleration life experiments of SSR has been designed. The acceleration life experiment has been conducted under the condition of 125 degree centigrade junction temperature. According to the 0 number device failure in the acceleration life experiment, using unilateral approximate, the lower limit value of MTBF has been calculated under the condition of 90 percent confidence level. If the typical value of 0.7eV active energy for the SSR degradation is choosed in the accelerated life experiment, then the lower limit value of MTBF can be calculated under the condition of 85 degree centigrade junction temperature.

Keywords

life testing; relays; accelerated life experiment; device failure; junction temperature; solid state relay; temperature 125 degC; temperature 85 degC; unilateral approximation; Acceleration; Current; Integrated circuit reliability; Relays; Switches; Voltage measurement; Solid State Relay; acceleration life experiments; failure mechanism; reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on

Conference_Location

Xi´an

Print_ISBN

978-1-4577-1229-6

Type

conf

DOI

10.1109/ICQR2MSE.2011.5976628

Filename

5976628