Title :
A New Technique for Calibrating Dual Six-Port Networks with Application to S Parameter Measurements
Abstract :
This paper describes a new technique for the simultaneous calibration of two six-port networks as reflectometers. Once calibrated, the complete S parameters of an unknown two-port network can be obtained from power measurements alone. The technique requires only a uniform transmission line, of unknown length and loss, and a short circuit as calibrating standards. Its application to an automated microwave measurement system is described and potential error sources are quantitatively discussed.
Keywords :
Calibration; Circuits; Detectors; Microwave measurements; Phase measurement; Power measurement; Power transmission lines; Propagation losses; Scattering parameters; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1978 IEEE-MTT-S International
Conference_Location :
Ottawa, ON, Canada
DOI :
10.1109/MWSYM.1978.1123829