• DocumentCode
    2648646
  • Title

    Infinite failure models for a finite world: A simulation study of the fault discovery process

  • Author

    Jones, Wendell ; Gregory, David

  • Author_Institution
    BNR, Inc., RTP, NC, USA
  • fYear
    1993
  • fDate
    3-6 Nov 1993
  • Firstpage
    284
  • Lastpage
    293
  • Abstract
    Many software reliability growth models have been published in journals and conference proceedings over the last 20-25 years. Each one has been justified based on theoretical or empirical evidence. Although there are many ways of classifying these models, a particularly interesting classification involves distinguishing models based upon the asymptotic expected number of total failures. These models are termed infinite and finite failure models since each one expects infinite and finite failures respectively as time approaches infinity. As might be expected, theoretic and especially empirical justification for the appropriateness of infinite failure models came after justifications for finite failure models. Infinite failure models were associated with weak fault repair systems or possibly with highly nonuniform usage, although this term is non-specific. We demonstrate through simulations of black-box testing (and/or field usage) that infinite failure models are appropriate in situations where there is perfect and near-perfect repair and where usage is uniform for the vast majority of the system
  • Keywords
    data visualisation; program testing; software reliability; system recovery; black-box testing; classification; finite failure models; infinite failure models; simulations; software reliability growth models; total failures; weak fault repair systems; Conference proceedings; H infinity control; Hardware; History; Software quality; Software reliability; Software systems; Software testing; System testing; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 1993. Proceedings., Fourth International Symposium on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-8186-4010-3
  • Type

    conf

  • DOI
    10.1109/ISSRE.1993.624298
  • Filename
    624298