Title :
Failure mechanism and diagnosis strategy of MMIC
Author :
Li, Ping ; Chen, Yuan
Author_Institution :
Sci. & Technol. Lab. of Reliability Phys. & Applic. of Electron. Components, Fifth Res. Inst. of MIIT, Guangzhou, China
Abstract :
In this paper, the main failure mechanism and diagnosis strategy of GaAs MMIC have been presented. The function validation and decapulation are the key of failure diagnosis of GaAs MMIC. Typic failure analysis cases have been introduced.
Keywords :
III-V semiconductors; MMIC; failure analysis; fault diagnosis; gallium arsenide; integrated circuit reliability; GaAs; MMIC diagnosis strategy; failure analysis; failure diagnosis; failure mechanism; function validation; Earth Observing System; Electrostatic discharge; Failure analysis; Gallium arsenide; Logic gates; MMICs; Stress; diagnosis; failure; function validation; mechanism;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4577-1229-6
DOI :
10.1109/ICQR2MSE.2011.5976652
