Title :
Analysis of recent aluminum wire array experiments on z with k-shell yields of ~ 3 5 0 kj
Author :
Apruzese, J.P. ; Thorn hill, J.W. ; Davis, J. ; Clark, R.W. ; LePella, P.D. ; Coverdale, C.A. ; Jones, B. ; Deeney, C.
Author_Institution :
Div. of Plasma Phys., Naval Res. Lab., Washington, DC
Abstract :
Summary form only given. For a relatively low atomic number element such as aluminum, sufficient electron temperature to reach the K- shell stages can be attained by imploding wire loads with a current of only a few mega amperes. Therefore, on Sandia National Laboratories´ Z generator (20 MA), the key to achieving very high yields of Al K-shell radiation is to implode and ionize a much higher mass (not hotter temperature) of Al than can be done on more modest machines. This was successfully accomplished, beginning soon after Z started operations. More recent shots have more than doubled Z´s initially achieved K-shell yields, mostly by ionizing a greater mass of Al while maintaining sufficient temperatures for good K-shell emissivity. We have analyzed X-ray data from the nested Al array shots Z1519 and Z1520. These experiments reduced some of the highest Al K-shell line opacities yet observed in laboratory plasmas. A key factor in the diagnosis is the presence of Mg lines from that element´s 5% component of the Al 5056 alloy. The measured ratio of the Mg to Al lines well exceeds the ~5% one would expect from an optically thin plasma. Reproducing the observed ratio from the two elements is an important constraint on the model diagnosis, and is a key quantitative indicator of the line optical depths
Keywords :
aluminium; emissivity; exploding wires; explosions; ionisation; opacity; plasma diagnostics; plasma temperature; 20 MA; Al; Al 5056 alloy; K-shell emissivity; K-shell line opacities; K-shell radiation; Z generator; aluminum wire array; atomic number; electron temperature; imploding wire loads; line optical depths; optically thin plasma; Aluminum; Atomic measurements; Data analysis; Electrons; Ionizing radiation; Laboratories; Plasma diagnostics; Plasma measurements; Plasma temperature; Wire;
Conference_Titel :
Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
Conference_Location :
Traverse City, MI
Print_ISBN :
1-4244-0125-9
DOI :
10.1109/PLASMA.2006.1707150