• DocumentCode
    26492
  • Title

    Multifrequency Method for Measuring Properties of Shock Tube Produced Plasma

  • Author

    Hui Ma ; Ming Bai ; Jungang Miao

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
  • Volume
    43
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    2628
  • Lastpage
    2635
  • Abstract
    A novel multifrequency method is introduced in this paper for measuring the plasma produced by a Φ800-mm shock tube. The core of the measured object is a volume of relatively uniform plasma contained by the rectangular test section, and the dual-frequency or multifrequency configuration of the measuring system enables the coherent cancellation of measurement deviations. Based on the Lorentz model of plasma, the obvious correspondence exists between the plasma parameters and the transmittance variation with different frequencies of the electromagnetic wave; hence, the electron density Ne and the collision frequency ν of the plasma could be retrieved according to the measured transmittance. A dual-frequency system is established as the verification of the proposed method. The measured values of the electron density by the proposed method are compared with those obtained by other means, and the results are in good agreement.
  • Keywords
    electron density; plasma collision processes; plasma density; plasma diagnostics; plasma electromagnetic wave propagation; plasma sources; shock tubes; dual-frequency configuration; electromagnetic wave frequencies; electron density; multifrequency configuration; plasma Lorentz model; plasma collision frequency; rectangular test section; shock tube produced plasma; transmittance variation measurement; Electric shock; Electron tubes; Frequency measurement; Microwave measurement; Microwave theory and techniques; Plasma measurements; Plasmas; Collision frequency; electron density; multifrequency method; plasma; shock tube; shock tube.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2015.2450771
  • Filename
    7169592