• DocumentCode
    2649554
  • Title

    Analog test design with IDD measurements for the detection of parametric and catastrophic faults

  • Author

    Lindermeir, Walter M. ; Vogels, Thomas J. ; Graeb, Helmut E.

  • Author_Institution
    Inst. of Electron. Design Autom., Tech. Univ. of Munich, Germany
  • fYear
    1998
  • fDate
    23-26 Feb 1998
  • Firstpage
    822
  • Lastpage
    827
  • Abstract
    Earlier approaches dealt with the detection of catastrophic faults based on IDD monitoring. Consideration of the more subtle parametric faults and the ADC quantization noise, however, is essential for high-quality analog testing. The paper presents a new design method for analog test of parametric and catastrophic faults by IDD monitoring. ADC quantization noise is systematically considered throughout the method. Results prove its effectiveness
  • Keywords
    analogue integrated circuits; automatic testing; electric current measurement; fault diagnosis; integrated circuit testing; quantisation (signal); ADC quantization noise; IDD measurements; IC testing; analog test design; catastrophic faults; high-quality analog testing; parametric faults; Circuit faults; Circuit testing; Current measurement; Current supplies; Fault detection; Integrated circuit measurements; Integrated circuit testing; Manufacturing processes; Noise measurement; Power supplies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 1998., Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-8359-7
  • Type

    conf

  • DOI
    10.1109/DATE.1998.655953
  • Filename
    655953
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2649554