• DocumentCode
    2649948
  • Title

    Electron multipactor discharge on a dielectric in a finite geometry

  • Author

    Lockwood, N.P. ; Cartwright, K.L. ; Lau, Y.Y. ; Verbonceur, J.P.

  • Author_Institution
    Air Force Res. Lab., Kirtland AFB, NM
  • fYear
    2006
  • fDate
    4-8 June 2006
  • Firstpage
    322
  • Lastpage
    322
  • Abstract
    Summary form only given. Electron multipactor breakdown of the dielectric window separating vacuum from a gas in a high power microwave system is a common problem that limits the output power of the system. This study examines the impact of finite waveguide geometries and low and moderate pressure gases on electron multipactor growth and power deposition on the dielectric window. The spatial and temporal evolution of the power deposition, electron number density, and average electron energy in vacuum and in low and moderate pressure (<200 torr) electropositive and electronegative gases is discussed. Results of the simulation show that the multipactor discharge starts at the edge and moves to the center of the dielectric given a large enough field. In addition, electron multipactor results from 1-D, 2-D, & pseudo-3D particle-in-cell (PIC) simulations are compared. A large discrepancy is shown to exist in the number of electrons produced between the 1-D, 2-D and pseudo-3D simulations due to electrons being lost to the waveguide wall
  • Keywords
    high-frequency discharges; plasma boundary layers; plasma density; plasma filled waveguides; plasma simulation; dielectric window; electron energy; electron multipactor discharge; electron number density; electronegative gases; electropositive gases; finite waveguide geometries; high power microwave system; power deposition; pseudo3D particle-in-cell simulations; Dielectric breakdown; Electrons; Elementary particle vacuum; Gases; Geometry; Laboratories; Power generation; Vacuum breakdown; Vacuum systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
  • Conference_Location
    Traverse City, MI
  • Print_ISBN
    1-4244-0125-9
  • Type

    conf

  • DOI
    10.1109/PLASMA.2006.1707195
  • Filename
    1707195