Title :
Automatic on-line memory tests in workstations
Author :
Elm, Christian ; Klein, Michael ; Tavangarian, Djamshid
Author_Institution :
Fern Univ., Hagen, Germany
Abstract :
This paper presents a new approach called Stochastic Memory Allocation (SMA) to enhance the safety of workstations. It applies deterministic functional memory tests to the main memory of a workstation having parts of it selected stochastically in a sequential manner. The tests are carried our during normal work dynamically in parallel to other running processes. Important parameters are the amount of the selected part of the memory to be tested and the time between two tests considering the intensity the contents of the physical memory is changed by the memory management system. This new method may be used without changes concerning the kernel of the operating system or the hardware of the workstations
Keywords :
automatic testing; computer testing; integrated circuit testing; integrated memory circuits; workstations; automatic online memory tests; deterministic functional memory tests; stochastic memory allocation; workstation main memory; Automatic testing; Content management; Kernel; Memory management; Operating systems; Safety; Sequential analysis; Stochastic processes; System testing; Workstations;
Conference_Titel :
Memory Technology, Design and Testing, 1994., Records of the IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-6245-X
DOI :
10.1109/MTDT.1994.397190